CONF Tommasi_GCPR_2015/IDIAP A Deeper Look at Dataset Bias Tommasi, Tatiana Patricia, Novi Caputo, Barbara Tuytelaars, Tinne German Conference on Pattern Recognition Aachen, Germany Lecture Notes in Computer Science 9358 504–516 978-3-319-24947-6; 978-3-319-249 2015 Springer International Publishing 10.1007/978-3-319-24947-6_42 doi