Stan Z.Li - Idiap Publications

First name(s):	Stan
Last name(s):	Z.Li

Anti-spoofing: Evaluation Methodologies, Ivana Chingovska, André Anjos and Sébastien Marcel, in: Encyclopedia of Biometrics, Springer US, 2014

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Anti-Spoofing: Face Databases, André Anjos, Ivana Chingovska and Sébastien Marcel, in: Encyclopedia of Biometrics, Springer US, 2014

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Evaluation Databases, Stan Z.Li, Javier Galbally, André Anjos and Sébastien Marcel, in: Handbook of Biometric Anti-Spoofing, pages 247-278, Springer-Verlag, 2014

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Evaluation Methodologies, Ivana Chingovska, André Anjos and Sébastien Marcel, in: Handbook of Biometric Antispoofing, Springer, 2014

Face Anti-spoofing: Visual Approach, André Anjos, Jukka Komulainen, Sébastien Marcel, Abdenour Hadid and Matti Pietikainen, in: Handbook of Biometric Anti-Spoofing, pages 65-82, Springer-Verlag, 2014

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The 2nd competition on counter measures to 2D face spoofing attacks, Ivana Chingovska, Jinwei Yang, Zhen Lei, Dong Yi, Stan Z.Li, Olga Kähm, Naser Damer, Christian Glaser, Arjan Kuijper, Alexander Nouak, Jukka Komulainen, Tiago de Freitas Pereira, Shubham Gupta, Shubham Bansal, Shubham Khandelwal, Ayush Rai, Tarun Krishna, Dushyant Goyal, Muhammad-Adeel Waris, Honglei Zhang, Iftikhar Ahmad, Serkan Kiranyaz, Moncef Gabbouj, Roberto Tronci, Maurizio Pili, Nicola Sirena, Fabio Roli, Javier Galbally, Julian Fierrez, Allan Pinto, Helio Pedrini, William Robson Schwartz, Anderson Rocha, André Anjos and Sébastien Marcel, in: International Conference of Biometrics 2013, Madrid, Spain, 2013

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Competition on Counter Measures to 2-D Facial Spoofing Attacks, Murali Mohan Chakka, André Anjos, Sébastien Marcel, Roberto Tronci, Daniele Muntoni, Gianluca Fadda, Maurizio Pili, Nicola Sirena, Gabriele Murgia, Marco Ristori, Fabio Roli, Junjie Yan, Dong Yi, Zhen Lei, Zhiwei Zhang, Stan Z.Li, William Robson Schwartz, Anderson Rocha, Helio Pedrini, Javier Lorenzo-Navarro, Modesto Castrillón-Santana, Jukka Maatta, Abdenour Hadid and Matti Pietikainen, in: Proceedings of IAPR IEEE International Joint Conference on Biometrics (IJCB), Washington DC, USA, 2011

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